ti.\*:("5th International Conference on Spectroscopic Ellipsometry (ICSE-V)")
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5th International Conference on Spectroscopic Ellipsometry (ICSE-V)TOMPKINS, Harland G.Thin solid films. 2011, Vol 519, Num 9, issn 0040-6090, 444 p.Conference Proceedings
Application of ellipsometry techniques to biological materialsARWIN, Hans.Thin solid films. 2011, Vol 519, Num 9, pp 2589-2592, issn 0040-6090, 4 p.Conference Paper
Ellipsometric study of nanostructured carbon films deposited by pulsed laser depositionBEREZNAI, M; BUDAI, J; HANYECZ, I et al.Thin solid films. 2011, Vol 519, Num 9, pp 2989-2993, issn 0040-6090, 5 p.Conference Paper
Generalized ellipsometry of artificially designed line width roughnessFOLDYNA, Martin; GERMER, Thomas A; BERGNER, Brent C et al.Thin solid films. 2011, Vol 519, Num 9, pp 2633-2636, issn 0040-6090, 4 p.Conference Paper
Improvement for sensitivity of biosensor with total internal reflection imaging ellipsometry (TIRIE)LI LIU; CHEN, Yan-Yan; MENG, Yong-Hong et al.Thin solid films. 2011, Vol 519, Num 9, pp 2758-2762, issn 0040-6090, 5 p.Conference Paper
Optical characterization of nanocrystals in silicon rich oxide superlattices and porous siliconAGOCS, E; PETRIK, P; MILITA, S et al.Thin solid films. 2011, Vol 519, Num 9, pp 3002-3005, issn 0040-6090, 4 p.Conference Paper
Rotatable broadband retarders for far-infrared spectroscopic ellipsometryKANG, T. D; STANDARD, E; CARR, G. L et al.Thin solid films. 2011, Vol 519, Num 9, pp 2698-2702, issn 0040-6090, 5 p.Conference Paper
Rotating compensator sampling for spectroscopic imaging ellipsometryMENG, Y. H; JIN, G.Thin solid films. 2011, Vol 519, Num 9, pp 2742-2745, issn 0040-6090, 4 p.Conference Paper
Vacuum-ultraviolet reflectance difference spectroscopy for characterizing dielectrics―semiconductor interfacesOGATA, Shoichi; OHNO, Shinya; TANAKA, Masatoshi et al.Thin solid films. 2011, Vol 519, Num 9, pp 2830-2833, issn 0040-6090, 4 p.Conference Paper
Optical conductivity of fci-ZnMgRE quasicrystalsTUMENAS, S; KARPUS, V; ARWIN, H et al.Thin solid films. 2011, Vol 519, Num 9, pp 2951-2954, issn 0040-6090, 4 p.Conference Paper
Studies of optical anisotropy in opals by normal incidence ellipsometryREZA, A; BALEVICIUS, Z; VAISNORAS, R et al.Thin solid films. 2011, Vol 519, Num 9, pp 2641-2644, issn 0040-6090, 4 p.Conference Paper
Transmission Mueller matrix ellipsometry of chirality switching phenomenaARTEAGA, Oriol; EL-HACHEMI, Zoubir; CANILLAS, Adolf et al.Thin solid films. 2011, Vol 519, Num 9, pp 2617-2623, issn 0040-6090, 7 p.Conference Paper
Validity of Lorentz―Lorenz equation in porosimetry studiesSCHWARZ, Daniel; WORMEESTER, Herbert; POELSEMA, Bene et al.Thin solid films. 2011, Vol 519, Num 9, pp 2994-2997, issn 0040-6090, 4 p.Conference Paper
Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometryBARROSO, F; BOSCH, S; TORT, N et al.Thin solid films. 2011, Vol 519, Num 9, pp 2801-2805, issn 0040-6090, 5 p.Conference Paper
Determination of the refractive index of single crystal bulk samples and micro-structuresSCHMIDT-GRUND, R; KÜHNE, P; CZEKALLA, C et al.Thin solid films. 2011, Vol 519, Num 9, pp 2777-2781, issn 0040-6090, 5 p.Conference Paper
Ellipsometric characterisation of thin films non-uniform in thicknessNECAS, David; FRANTA, Daniel; BURSIKOVA, Vilma et al.Thin solid films. 2011, Vol 519, Num 9, pp 2715-2717, issn 0040-6090, 3 p.Conference Paper
Investigation of surface roughness on etched glass surfacesPAPA, Z; BUDAI, J; FARKAS, B et al.Thin solid films. 2011, Vol 519, Num 9, pp 2903-2906, issn 0040-6090, 4 p.Conference Paper
Optical properties of GaAs0.9-xNxSb0.1 alloy films studied by spectroscopic ellipsometrySEDRINE, N. Ben; BOUHAFS, C; SCHUBERT, M et al.Thin solid films. 2011, Vol 519, Num 9, pp 2838-2842, issn 0040-6090, 5 p.Conference Paper
Optical properties of gold island films―a spectroscopic ellipsometry studyLONCARIC, Martin; SANCHO-PARRAMON, Jordi; ZORC, Hrvoje et al.Thin solid films. 2011, Vol 519, Num 9, pp 2946-2950, issn 0040-6090, 5 p.Conference Paper
Optimized calibration and measurement procedures in rotating analyzer and rotating polarizer ellipsometryMÜNZ, F; HUMLICEK, J; MARSIK, P et al.Thin solid films. 2011, Vol 519, Num 9, pp 2703-2706, issn 0040-6090, 4 p.Conference Paper
Plasmon resonance shift during grazing incidence ion sputtering on Ag(001)WORMEESTER, Herbert; EVERTS, Frank; POELSEMA, Bene et al.Thin solid films. 2011, Vol 519, Num 9, pp 2664-2667, issn 0040-6090, 4 p.Conference Paper
Plasmonics and effective-medium theoriesASPNES, D. E.Thin solid films. 2011, Vol 519, Num 9, pp 2571-2574, issn 0040-6090, 4 p.Conference Paper
Selective sensitivity of ellipsometry to magnetic nanostructuresPOSTAVA, K; HRABOVSKY, D; HAMRLOVA, J et al.Thin solid films. 2011, Vol 519, Num 9, pp 2627-2632, issn 0040-6090, 6 p.Conference Paper
Temperature dependent model dielectric function of highly disordered Ga0.52In0.48PMONTGOMERY, E; KRAHMER, C; STREUBEL, K et al.Thin solid films. 2011, Vol 519, Num 9, pp 2859-2862, issn 0040-6090, 4 p.Conference Paper
Terahertz ellipsometry and terahertz optical-Hall effectHOFMANN, T; HERZINGER, C. M; TEDESCO, J. L et al.Thin solid films. 2011, Vol 519, Num 9, pp 2593-2600, issn 0040-6090, 8 p.Conference Paper
